ENE 6360-0

Brief

This course aims to provide students with a comprehensive view of semiconductor material and device charaterization techniques. After completing this course, the students will be able to understand the physics, the principles, and measurement methods for basic semiconductor device characterizations.

Description

Course keywords: 半導體, 元件, 材料, 量測, Semiconductor, Device, Material, Measurement 一,課程說明(Course Description) This course aims to provide students with a comprehensive view of semiconductor material and device charaterization techniques. After completing this course, the students will be able to understand the physics, the principles, and measurement methods for basic semiconductor device characterizations. 二,指定用書(Text Books) 1. Dieter K Schroder, Semiconductor material and device characterization, Wiley InterScience (Online service), 2006. 三,參考書籍(References) None. 四,教學方式(Teaching Method) Lecture in Chinese. 五,教學進度(Syllabus) 1. Resistivity(two weeks) 2. Carrier and Doping Density(two weeks) 3. Contact Resistance and Schottky Barriers(two weeks) 4. Series Resistance, Channel Length and Width, and Threshold Voltage(two weeks) 5. Defects(two weeks) 6. Oxide and Interface Trapped Charges, Oxide Thickness(two weeks) 7. Carrier Lifetimes(two weeks) 8. Mobility(two weeks) 六,成績考核(Evaluation) To be determined 七,講義位址(http://) elearn.nthu.edu.tw 八,本課程無涉及AI使用 Not applicable

Timetable

Scores

Average Percentage 85.69

Std. Deviation 6.24

Remarks

Restrictions

半導體學院,電子所優先，第3次選課起開放全校修習

Compulsory

Elective

Cross Discipline

First Specialization

Second Specialization